Scanning tunneling microscope
The scanning tunneling microscope (not to be confused with scanning electron microscopes), or STM, was invented in 1981 by Gerd Binnig and Heinrich Rohrer of IBM's Zurich Lab in Zurich, Switzerland. The invention garnered the two a Nobel prize for physics in 1986. The STM allows scientists to see and position individual atoms with higher resolution than its related cousin, the atomic force microscope (AFM). Both the STM and the AFM fall under the class of scanning probe microscopy instruments.
See also
- Microscopy
- Scanning probe microscopy
- Scanning tunneling spectroscopy
- Electrochemical scanning tunneling microscope
- Atomic force microscope
~ Table of Content ~
| ► | Introduction |
| ► | Overview |
| ► | Use of the STM |
| ► | See also |
| ► | External links |
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