Alfred Binet

Alfred Binet (July 11, 1857 – October 18, 1911), French psychologist and inventor of the first usable intelligence test, the basis of today's IQ test.

Related Topics:
July 11 - 1857 - October 18 - 1911 - French - Psychologist - Inventor - Intelligence test - IQ test

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Binet was a French psychologist who published the first modern intelligence test, the Binet-Simon intelligence scale, in 1905. His principal goal was to identify students who needed special help in coping with the school curriculum. Along with his collaborator Theodore de Simon, Binet published revisions of his intelligence scale in 1908 and 1911, the last appearing just before his untimely death. A further refinement of the Binet-Simon scale was published in 1916 by Lewis M. Terman, from Stanford University, who incorporated the German psychologist William Stern's proposal that an individual's intelligence level be measured as an intelligence quotient (I.Q.). Terman's test, which he named the Stanford-Binet Intelligence Scale formed the basis for one of the modern intelligence tests still commonly used today. They are all colloquially known as IQ tests.

Related Topics:
1905 - Theodore de Simon - 1916 - Lewis M. Terman - Stanford-Binet Intelligence Scale

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